December 11, 2017
Comments Off on A Low-Voltage Radiation-Hardened 13T SRAM Bit cell for Ultralow Power Space Applications
Posted in: IEEE 2017, VLSI
A Low-Voltage Radiation-Hardened 13T SRAM Bitcell for Ultralow Power Space Applications Abstract: Continuous transistor scaling, coupled with the growing demand for low-voltage, low-power applications, increases the susceptibility of VLSI circuits to soft-errors, especially when exposed to extreme environmental conditions, such as those encountered by space applications. The most vulnerable of these circuits are memory arrays […]
December 11, 2017
Comments Off on A Fine-Grained Control Flow Integrity Approach Against Runtime Memory Attacks for Embedded Systems
Posted in: IEEE 2017, VLSI
A Fine-Grained Control Flow Integrity Approach Against Runtime Memory Attacks for Embedded Systems Abstract Runtime attacks on memory, such as buffer overflow based stack smashing and code reuse attacks, are common in embedded systems. Control flow integrity (CFI) has been acknowledged as one promising approach to protect against such runtime attacks. However, previous CFI implementations suffer from coarse granularity (which can be circumvented by an advanced attack model) and high-performance overhead. In this […]