December 11, 2017
Comments Off on Fault Tolerant Parallel Filters Based on Error Correction Codes
Posted in: IEEE 2017, VLSI
Fault Tolerant Parallel Filters Based on Error Correction Codes Abstract Digital filters are widely used in signal processing and communication systems. In some cases, the reliability of those systems is critical, and fault tolerant filter implementations are needed. Over the years, many techniques that exploit the filters’ structure and properties to achieve fault tolerance have been proposed. As technology scales, it enables more complex […]
December 11, 2017
Comments Off on Enhanced Built-In Self-Repair Techniques for Improving Fabrication Yield and Reliability of Embedded Memories
Posted in: IEEE 2017, VLSI
Enhanced Built-In Self-Repair Techniques for Improving Fabrication Yield and Reliability of Embedded Memories Abstract Error correction code (ECC) and built-in self-repair (BISR) techniques by using redundancies have been widely used for improving the yield and reliability of embedded memories. The target faults of these two schemes are soft errors and permanent (hard) faults, respectively. In recent works, there are also some techniques integrating ECC and BISR to deal with soft […]