December 9, 2017
Comments Off on Double-Tip Artefact Removal from Atomic Force Microscopy Images
Posted in: IEEE 2017, MATLAB
Double-Tip Artefact Removal from Atomic Force Microscopy Images Abstract: The atomic force microscopy (AFM) allows the measurement of interactions at interfaces with nanoscale resolution. Imperfections in the shape of the tip often lead to the presence of imaging artifacts, such as the blurring and repetition of objects within images. In general, these artifacts can only […]
December 9, 2017
Comments Off on Data-driven Soft Decoding of Compressed Images in Dual Transform-Pixel Domain
Posted in: IEEE 2017, MATLAB
Data-Driven Soft Decoding of Compressed Images in Dual Transform-Pixel Domain Abstract: In the large body of research literature on image restoration, very few papers were concerned with compression-induced degradations, although in practice, the most common cause of image degradation is compression. This paper presents a novel approach to restoring JPEG-compressed images. The main innovation is […]